Scanning Electron Microscope

The SEM microscope is a FEI Quanta 650F Scanning Electron Microscope equipped with twin Bruker 30mm2 Energy Dispersive Spectrometers (EDS), SE and BSE detectors. The chemical composition of the sample can be analyzed with the two EDS detectors, either by point analysis or by elemental mapping, in general for elements with a concentration lager than 0.5 %. The Esprit software (Bruker) can also perform particle “feature” analysis and the “job” is a function that can help performing the measurement automatically.

The SEM microscope has large chamber and custom-made holders, which allow analysis of a wide range of samples, polished blocks, thin sections and rock slabs.

Our equipment is available for both internal and external users. All new users will receive initial one-on-one training after attending a basic training lecture, which will take place at DTU Nanolab.